Prerequisites: EE 100A; restricted to class level standing of senior; or graduate standing; or consent of instructor
Description: Covers essentials of electrical transient induced failures to integrated circuits (IC) and systems. Addresses basics for different failure and testing models including electrostatic discharge (ESD). Discusses design-for-reliability (DFR) techniques such as ESD protection designs at IC, module, and system levels. Enhances learning with computer aided design (CAD) laboratories.
Credit: Credit is awarded for one of the following EE 165 or EE 282D.