Prerequisites: graduate standing; or consent of instructor

Description: Covers essentials of electrical transient induced failures to integrated circuits (IC) and systems. Addresses basics for different failure and testing models including electrostatic discharge (ESD). Discusses design-for-reliability (DFR) techniques such as ESD protection designs at IC, module, and system levels. Enhances learning with computer aided design (CAD) laboratories.

Credit: May be taken Satisfactory (S) or No Credit (NC) with consent of instructor and graduate advisor. Credit is awarded for one of the following EE 282D or EE 165.