Prerequisites: ME 114
Description: Covers structure of materials at the nanoscale, including semiconductors, ceramics, metals, and carbon nanotubes. Explores relationships among morphology, properties, and processing. Addresses primary methods of characterization, including scanning electron microscopy, scanning probe microscopy, X-ray diffraction, and transmission electron microscopy. Also covers elementary discussions of X-ray, vibrational, and electron waves in solids and introductory diffraction theory.