Prerequisites: ME 114
Description: Covers structure of materials at the nano- scale, including semiconductors, ceramics, metals, and carbon nanotubes. Explores relationships among morphology, properties, and processing. Addresses primary methods of characterization, including scan- ning electron microscopy, scanning probe micros- copy, X-ray diffraction, and transmission electron microscopy. Also covers elementary discussions of X-ray, vibrational, and electron waves in solids and introductory diffraction theory.