MSE 161: Analytical Materials Characterization

← 2011-12 2012-13 2013-14 →
← 2011-12 ← 2011-12 changes (lax) changes (strict) ▾ 2013-14 → 2013-14 →

Units: 4

Hours: Lecture, 3 hours; laboratory, 3 hours

Catalog page 323

Prerequisites: MSE 160

Description: Analysis of the surfaces of materials via ion, electron, and photon spectroscopies. Includes Rutherford back scattering; secondary ion mass spectroscopy; electron energy loss spectroscopy; "VHFSFMFDUSPOTQFDUSPTDPQZ9SBZQIPUPFMFDUSPO TQFDUSPTDPQZQIPUPMVNJOFTDFODFFYUFOEFE9SBZ absorption fine structure; Fourier transfrom infrared spectroscopy; and Raman spectroscopy. Also covers sputtering, high-vacuum generation, and focused ion beam milling.

Derived Information — The following is not part of the official catalog but is computed from catalog data.
Prerequisite graph not available.

Referenced in

Enrollment History (from UCR Banner, not catalog)
Combined: EE 161 / MSE 161
Year F W S Su Total
2025-26 17/20 17/20
2024-25 12/12 12/12
2023-24 24/24  9/12 33/36
2022-23 19/25 19/25
2021-22 22/25 22/25
2020-21 20/25 20/25
2019-20 21/25 21/25
2018-19 12/20 12/20
2017-18 22/22 22/22
2016-17 22/20 22/20