Prerequisites: MSE 160
Description: Analysis of the surfaces of materials via ion, electron, and photon spectroscopies. Includes Rutherford back scattering; secondary ion mass spec- troscopy; electron energy loss spectroscopy; Auger electron spectroscopy; X-ray photoelectron spec- troscopy; photoluminescence; extended X-ray absorp- tion fine structure; Fourier transfrom infrared spec- troscopy; and Raman spectroscopy. Also covers sput- tering, high-vacuum generation, and focused ion beam milling.