Prerequisites: MSE 160
Description: Analysis of the surfaces of materials via ion, electron, and photon spectroscopies. Covers Rutherford back scattering; secondary ion mass spectroscopy; electron energy loss spectroscopy; Auger electron spectroscopy; X-ray photoelectron spectroscopy; photoluminescence; extended X-ray absorption fine structure; Fourier transform infrared spectroscopy; Raman spectroscopy; sputtering; high-vacuum generation; and focused ion beam milling.
Cross-listing: Cross-listed with EE 161.