Prerequisites: MSE 160
Description: Analysis of the surfaces of materials via ion, electron, and photon spectroscopies. Includes Rutherford back scattering; secondary ion mass spectroscopy; electron energy loss spectroscopy; Auger electron spectroscopy; X-ray photoelectron spectroscopy; photoluminescence; extended X-ray absorption fine structure; Fourier transform infrared spectroscopy; and Raman spectroscopy. Also covers sputtering, high-vacuum generation, and focused ion beam milling.