Prerequisites: ME 114
Description: Covers structure of materials at the nanoscale, including semiconductors, ceram- ics, metals, and carbon nanotubes. Explores relation- ships among morphology, properties, and processing. Addresses primary methods of characterization, including scanning electron microscopy, scanning probe microscopy, X-ray diffraction, and transmission electron microscopy. Also covers elementary discus- sions of X-ray, vibrational, and electron waves in solids and introductory diffraction theory.